Test Sockets Use List │ Products & Services │ YAMAICHI ELECTRONICS

Probe Card

Use List

Offering optimal solutions for diversified packages and test specifications with our design and production know-how cultivated with test burn-in sockets.

1-1(Total 1 Count)


Non-magnetic socket

Designed with non-magnetic components including spring probe pins for sensor device tests.
Supporting up to 0.4-mm pitch application.
For details, please contact Yamaichi representative.

  • 1
Burn-in Sockets
Test Sockets
Probe Card